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GrainGenes Reference Report: ACN-3-770

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Reference	ACN-3-770
Title	Advances in localization and molecular markers of wheat leaf rust resistance genes
Journal	Agricultural Sciences in China
Year	2004
Volume	3
Pages	770-779
Author	Yang W Liu D
Abstract	The localization, designation and molecular markers of wheat leaf rust (caused by Puccinia recondita f.sp. tritici [ Puccinia hordei ]) resistance genes are presented
Keyword	[ Hide all but 1 of 27 ] biological control chromosome maps control disease resistance fungal diseases gene gene location gene mapping genes genetic markers hordei leaf leaves localization markers molecular marker pathogens pathology plant diseases plant pathogenic fungi plant pathogens plant pathology plant pests plant protection resistance resistance genes wheat

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