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GrainGenes Author Report: Wang LL

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Author
Wang LL
Paper
ReferenceZhou XL et al. (2011) Genetics and molecular mapping of genes for high-temperature resistance to stripe rust in wheat cultivar Xiaoyan 54 Theoretical and Applied Genetics 123:431-438.
ReferencePan JW et al. (2004) Root border cell development is a temperature-insensitive and al-sensitive process in barley Plant and Cell Physiology 45:751-760.
ReferenceZhu MYY et al. (2003) Mutation induced enhancement of Al tolerance in barley cell lines Plant Science 164:17-23.

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